Views: 20 Author: Sanwood Technology Publish Time: 2024-12-11 Origin: Sanwood Technology
JESD22-A106B.01-2016 is a standard on thermal shock testing issued by JEDEC (Joint Electron Device Engineering Council), which specifies the methods and requirements for thermal shock testing to evaluate the resistance and adaptability of a sample under test when it is subjected to sudden and drastic temperature changes.
Description of the test standard
This thermal shock test is conducted to ensure the resistance and impact of semiconductor components to sudden exposure to extreme high and low temperatures. The rapid rate of temperature change in this test does not simulate the actual use of the real situation, but is intended to apply a more severe stress on the semiconductor components to accelerate the destruction of their vulnerable points and to find out the possible potential damage.
JESD22-A106B.01-2016 requirements for environmental test chamber
Temperature control accuracy: the test chamber is required to be able to accurately control the temperature to ensure that the amplitude of temperature fluctuation during testing is within the specified range.
Temperature change rate: the rapid conversion rate from high to low temperature (or vice versa) is specified to simulate the extreme temperature changes that may be encountered in actual use.
Temperature Uniformity: Requires uniform temperature distribution within the chamber to ensure that the sample under test is subjected to the same temperature impact during the test.
Two-zone Thermal shock chamber of Sanwood Technology
Temperature shock range: High temperature shock temperature range: +60℃~+150℃.
Low temperature shock temperature range:-40℃~-10℃.
(A:-40℃-+150℃:B:-55℃-+150℃:C:-65℃-+150℃)
High-temperature tank storage range: (1)Preheating upper temperature:+60℃~+200℃
(2) warming time: room temperature → +200 ℃ ≤ 45min (3.0 ~ 5.0 ℃ / min)
Note: warming time for the high-temperature tank alone when the performance of operation
Low temperature tank energy storage range: (1) pre-cooling lower limit temperature: -10 ℃ ~ -70 ℃
(2) cooling time: room temperature → -70 ℃ ≤ 60min (1.0 ~ 2.0 ℃ / min)
Note: cooling time for the performance of the cryogenic box running alone
Temperature shock recovery performance: High temperature exposure +150℃, more than 30 minutes, test time can be adjusted
Low temperature exposure -40℃, more than 30 minutes, test time can be adjusted
Temperature shock recovery time: ≤ 5min or less, under no load
Temperature fluctuation: ≤ ± 0.5 ℃, constant temperature test
Temperature uniformity: ≤2.0℃, tested when temperature is constant.
Temperature deviation: ≤±2℃, tested when the temperature is constant.
Basket switching time: within 10 seconds
Remarks:Temperature uniformity and deviation are measured under the condition of ambient temperature +25℃, relative humidity ≤85%R.H and no specimen.
Sanwood Technology's thermal shock test chamber meets the requirements of JESD22-A106B.01-2016 standard. Sanwood Technology has been focusing on the technology of more energy-saving and safer reliability environment test equipment, environment simulation exercise room system, FCT, ICT precision fixtures, total laboratory solutions, and its products have been widely used in scientific research colleges and universities, commodity inspection and quality control, national defence weapons, new energy vehicles, energy storage, precision electronics, semiconductor chips, solar photovoltaic, and other important fields, and has passed the It has passed ISO9001, ISO14001 and ISO45001 quality system certification, and is a national high-tech enterprise, Guangdong speciality and innovation enterprise, innovative enterprise and military-civilian integration enterprise.
